深度学习在光学计量中的应用：综述原文：Deep learning in optical metrology: a review 期刊：Light: Science & Applications (2022) 11:39 作者：Chao Zuo, Jiaming Qian, Shijie Feng, Wei Yin, Yixuan Li, Pengfei Fan, Jing Han, Kemao Qian, Qian Chen DOI：https://doi.org/10.1038/s41377-022-00714-x